Products display:
Axio Imager.A1 Mat coupled with UV-Visible-NIR Microspectrophotometer from CRAIC.
Scientific instrument designed to measure the UV-visible-NIR spectra of microscopic samples by transmittance, reflectance, polarization, fluorescence, and other types of luminescence that certified by NIST traceable standards. It also can be further upgraded to Raman microspectrometers, automation solutions, polarization and more accessories. With specialized software, they can be used to measure thin film thickness, colorimetry, SPR and optical characteristic in Material Research.

ZEISS Technology Workshop: MERLIN at National University of Singapore
MERLIN with the GEMINI II column combines ultra fast analytics, high resolution imaging using advanced detection modes, and future assured configuration flexibility into one single system.

During these workshops, you will fully experience the performance and capabilities of today’s most advanced FE-SEM system through the live demonstrations provided.

Please register early, as space is limited and is on a first come, first served basis.
ZEISS Technology Workshop: MERLIN Details and Registration

Date:
June 30 - July 05, 2013

Location:
1 Raffles Boulevard,
Suntec City International Convention and Exhibition Centre (SICEC),
Singapore 039593,
Level 3 & 4

Exhibitor:
Exhibition Booth S51